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Type: BOOK - Published: 2010-08-12 - Publisher: Springer Science & Business Media
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New
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Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh Univ
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Type: BOOK - Published: 2012-10-14 - Publisher: Springer Science & Business Media
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T
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Pages: 164
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Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF)