Related Books

Introduction to IDDQ Testing
Language: en
Pages: 336
Authors: S. Chakravarty
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of inp
IDDQ Testing of VLSI Circuits
Language: en
Pages: 121
Authors: Ravi K. Gulati
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in th
Introduction to Microelectronics to Nanoelectronics
Language: en
Pages: 350
Authors: Manoj Kumar Majumder
Categories: Science
Type: BOOK - Published: 2020-11-25 - Publisher: CRC Press

DOWNLOAD EBOOK

Focussing on micro- and nanoelectronics design and technology, this book provides thorough analysis and demonstration, starting from semiconductor devices to VL
ISTFA 1997: International Symposium for Testing and Failure Analysis
Language: en
Pages: 310
Authors: Grace M. Davidson
Categories: Technology & Engineering
Type: BOOK - Published: 1997-01-01 - Publisher: ASM International

DOWNLOAD EBOOK

Advances in Electronic Testing
Language: en
Pages: 431
Authors: Dimitris Gizopoulos
Categories: Technology & Engineering
Type: BOOK - Published: 2006-01-22 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a