Search Results for: X Ray Line Profile Analysis In Materials Science

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting resea

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a de

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m

The design and study of materials is a pivotal component to new discoveries in the various fields of science and technology. By better understanding the compone