Search Results for: Advanced Transmission Electron Microscopy Of Gan Based Materials And Devices

The unique materials properties of GaN-based semiconductors havestimulated a great deal of interest in research and developmentregarding nitride materials growt

The unique materials properties of GaN-based semiconductors have stimulated a great deal of interest in research and development regarding nitride materials gro

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and internation

The maturation of new semiconductor and device technology is dependent upon our understanding of device reliability. Silicon has had the benefit of more than 50