Search Results for: Force Microscopy

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully a

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an a

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and v

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated