Modeling Charged Defects and Defects Levels in Semiconductors and Oxides with DFT
Author | : |
Publisher | : |
Total Pages | : 58 |
Release | : 2015 |
ISBN-10 | : OCLC:953408762 |
ISBN-13 | : |
Rating | : 4/5 (62 Downloads) |
Book Synopsis Modeling Charged Defects and Defects Levels in Semiconductors and Oxides with DFT by :
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