Electron Microscopy Used for Fracture Mode Identification

Electron Microscopy Used for Fracture Mode Identification
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Total Pages : 15
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ISBN-10 : OCLC:227463541
ISBN-13 :
Rating : 4/5 (41 Downloads)

Book Synopsis Electron Microscopy Used for Fracture Mode Identification by : Charles R. Klarich

Download or read book Electron Microscopy Used for Fracture Mode Identification written by Charles R. Klarich and published by . This book was released on 1980 with total page 15 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metallurgical failure analysis represents a technology which combines the knowledge of many scientific and engineering disciplines. During these times of increasing product liability litigation, interest in failure analysis has intensified. The failure analyst is asked to identify the cause of catastrophic failures in many different materials. During past years at the proving ground, the list of materiel evaluated includes such diverse items as a cargo truck firewall and 175 mm gun tubes. The disciplines required include, metallography, chemical analysis, light and electron microscopy, stress analysis, and the measurement of mechanical properties. Effective failure analysis depends on a combination of factors; these include the assessment of prior manufacturing and service history, a knowledge of materials and available test methodology and finally, how these factors interrelate with the applied loads and design intent (1). Conventional failure analysis begins with a visual examination of the item to evaluate the material response to fracture. The analyst uses all the disciplines outlined above to focus the investigation on the cause of failure. A powerful tool in the analysis is the Scanning Electron Microscope (SEM) and the discipline called fractography. (Author).


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