Search Results for: Testing For Intermittent Failures In Combinational Circuits By Minimizing The Mean Testing Time For A Given Test Quality

Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality

Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality
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Total Pages : 40
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ISBN-10 : STANFORD:36105046381294
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Book Synopsis Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality by : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory

Download or read book Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt:


Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality Related Books

Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality
Language: en
Pages: 40

Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality

Authors: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
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Type: BOOK - Published: 1977 - Publisher:

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