Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
| Author | : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory |
| Publisher | : |
| Total Pages | : 36 |
| Release | : 1977 |
| ISBN-10 | : STANFORD:36105046381286 |
| ISBN-13 | : |
| Rating | : 4/5 (86 Downloads) |
Book Synopsis Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection by : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Download or read book Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1977 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt:
